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Support Center for Advanced Telecommunications Technology Research, Foundation (SCAT)
Best Poster Awards
Eunkyung Kim and Mehdi Tibouchi
Malware for Protocol Misidentification
Yudai Nagamine, Naoto Yanai, Shingo Okamura, and Toru Fujiwara
IWSEC 2016 List of Posters
Takumi Yamamoto (Mitsubishi Electric Corporation, Japan / UC Berkeley, USA), J.D. Tygar (UC Berkeley, USA)
Sven Wohlgemuth, Kazuo Takaragi (National Institute of Advanced Industrial Science and Technology (AIST), Japan)
Eunkyung Kim (Ewha Womans University, Republic of Korea), Mehdi Tibouchi (NTT Secure Platform Laboratories, Japan)
NEMU: Automated Extraction of Command-Dependent Bahaviors from Malware BinariesYuma Kurogome, Keiji Takeda (Keio University, Japan)
Akira Takenouchi, Kanta Matsuura (The University of Tokyo, Japan)
Junpei Yamaguchi, Masaya Yasuda (Kyushu University, Japan)
Shogo Masaki, Satoshi Hasegawa, Rina Okada, Koji Chida (NTT Secure Platform Laboratories, Japan)
Kazuharu Misawa (Tohoku Medical Megabank Organization, Tohoku University, Japan), Satoshi Hasegawa, Koki Hamada, Koji Chida (NTT Secure Platform Laboratories, Japan), Soichi Ogishima, Masao Nagasaki(Tohoku Medical Megabank Organization, Tohoku University, Japan)
Ayaka Samejima (The University of Electro-Communications, Japan), Mitsuhiro Hatada (NTT Communications, Japan), Hiroshi Yoshiura, Masatsugu Ichino(The University of Electro-Communications, Japan)
Phetlasy Sornxayya, Satoshi Ohzahata, Celimuge Wu, Toshihiko Kato (The University of Electro-Communications, Japan)
Carmen Kempka, Ryo Kikuchi, Susumu Kiyoshima, Koutarou Suzuki (NTT Secure Platform Laboratories, Japan)
Takashi Tsuchiya, Masahiro Fujita (Shizuoka University, Japan), Kenta Takahashi (Hitachi, Ltd., Japan), Takehisa Kato (Toshiba Corporation Industrial ICT Solutions Company, Japan), Fumihiko Magata(NTT Secure Platform Laboratories, Japan), Yoshimi Teshigawara(Tokyo Denki University, Japan), Ryoichi Sasaki (Tokyo Denki University, Japan), Masakatsu Nishigaki(Shizuoka University, Japan)
Hiroshi Nakagawa (The University of Tokyo, Japan)
Hiroaki Muramatsu, Masahiro Fujita, Yuto Mano (Shizuoka University, Japan), Kenta Takahashi (Hitachi, Ltd., Japan), Masakatsu Nishigaki(Shizuoka University)
Shogo Hayashi (Institute of Industrial Science, The University of Tokyo, Japan), Yu Asabe, Keiichi Ishikawa, Yuka Takahashi, Masashi Ikarashi (The University of Tokyo, Japan), Kanta Matsuura (Institute of Industrial Science, The University of Tokyo, Japan)
Yuuichi Kamoshida, Mitsugu Iwamoto, Kazuo Ohta (The University of Electro-Communications, Japan)
Metallic-Foil Artifact-Metrics for Smart Card Security EnhancementNaoki Yoshida, Tsutomu Matsumoto (YOKOHAMA National University, Japan)
Yudai Nagamine, Naoto Yanai, Shingo Okamura, Toru Fujiwara (Osaka University, Japan)
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