September 12 (Mon)-14 (Wed), 2016
Akihabara-Ochanomizu District, Tokyo, Japan
List of Posters
Best Poster Awards
FHE over the Integers and Modular Arithmetic Circuits
Eunkyung Kim and Mehdi Tibouchi
Malware for Protocol Misidentification
Yudai Nagamine, Naoto Yanai, Shingo Okamura, and Toru Fujiwara
IWSEC 2016 List of Posters
Identification of Cryptographic Functions in Malware Binaries Takumi Yamamoto (Mitsubishi Electric Corporation, Japan / UC Berkeley, USA), J.D. Tygar (UC Berkeley, USA)
A Toolset for Usable Security with ICT Service Networks Sven Wohlgemuth, Kazuo Takaragi (National Institute of Advanced Industrial Science and Technology (AIST), Japan)
FHE over the Integers and Modular Arithmetic Circuits Eunkyung Kim (Ewha Womans University, Republic of Korea), Mehdi Tibouchi (NTT Secure Platform Laboratories, Japan)
NEMU: Automated Extraction of Command-Dependent Bahaviors from Malware Binaries Yuma Kurogome, Keiji Takeda (Keio University, Japan)
Using a dummy node to protect Tor Hidden Service from the threat of a link classifier Akira Takenouchi, Kanta Matsuura (The University of Tokyo, Japan)
Efficient Update of Gram-Schmidt Vectors in the LLL Algorithm with Deep Insertions Junpei Yamaguchi, Masaya Yasuda (Kyushu University, Japan)
Evaluation Tool for Utility and Anonymity of Anonymized Data Shogo Masaki, Satoshi Hasegawa, Rina Okada, Koji Chida (NTT Secure Platform Laboratories, Japan)
Privacy preserving Fisher's exact test for GWAS Kazuharu Misawa (Tohoku Medical Megabank Organization, Tohoku University, Japan), Satoshi Hasegawa, Koki Hamada, Koji Chida (NTT Secure Platform Laboratories, Japan), Soichi Ogishima, Masao Nagasaki(Tohoku Medical Megabank Organization, Tohoku University, Japan)
A study on the infected traffic detection method focused on the similarity between malware samples Ayaka Samejima (The University of Electro-Communications, Japan), Mitsuhiro Hatada (NTT Communications, Japan), Hiroshi Yoshiura, Masatsugu Ichino(The University of Electro-Communications, Japan)
Combining two sequential algorithms for classification of intrusion detection system dataset Phetlasy Sornxayya, Satoshi Ohzahata, Celimuge Wu, Toshihiko Kato (The University of Electro-Communications, Japan)
Garbling Scheme for Formulas with Constant Size of Garbled Gates Carmen Kempka, Ryo Kikuchi, Susumu Kiyoshima, Koutarou Suzuki (NTT Secure Platform Laboratories, Japan)
Defamation Caused By Anonymization Hiroshi Nakagawa (The University of Tokyo, Japan)
A proposal of a biometric authentication system using human minute patterns Hiroaki Muramatsu, Masahiro Fujita, Yuto Mano (Shizuoka University, Japan), Kenta Takahashi (Hitachi, Ltd., Japan), Masakatsu Nishigaki(Shizuoka University)
Investigating Universal Metrics of Vulnerability Regarding Cross-Site Scripting Attacks Shogo Hayashi (Institute of Industrial Science, The University of Tokyo, Japan), Yu Asabe, Keiichi Ishikawa, Yuka Takahashi, Masashi Ikarashi (The University of Tokyo, Japan), Kanta Matsuura (Institute of Industrial Science, The University of Tokyo, Japan)
Application of Joux-Lucks Search Algorithm for Multi-Collisions to MicroMint Yuuichi Kamoshida, Mitsugu Iwamoto, Kazuo Ohta (The University of Electro-Communications, Japan)
Metallic-Foil Artifact-Metrics for Smart Card Security Enhancement Naoki Yoshida, Tsutomu Matsumoto (YOKOHAMA National University, Japan)
Posters were not rigorously refereed, and no proceedings were published regarding the posters,
and hence the copyrights of any content for the poster presentations are retained by the authors;
there is no restriction for the authors of the posters to submit the contents to other journals/conferences in the future.
Best Poster Awards
Eunkyung Kim and Mehdi Tibouchi
Malware for Protocol Misidentification
Yudai Nagamine, Naoto Yanai, Shingo Okamura, and Toru Fujiwara
IWSEC 2016 List of Posters
Takumi Yamamoto (Mitsubishi Electric Corporation, Japan / UC Berkeley, USA), J.D. Tygar (UC Berkeley, USA)
Sven Wohlgemuth, Kazuo Takaragi (National Institute of Advanced Industrial Science and Technology (AIST), Japan)
Eunkyung Kim (Ewha Womans University, Republic of Korea), Mehdi Tibouchi (NTT Secure Platform Laboratories, Japan)
NEMU: Automated Extraction of Command-Dependent Bahaviors from Malware BinariesYuma Kurogome, Keiji Takeda (Keio University, Japan)
Akira Takenouchi, Kanta Matsuura (The University of Tokyo, Japan)
Junpei Yamaguchi, Masaya Yasuda (Kyushu University, Japan)
Shogo Masaki, Satoshi Hasegawa, Rina Okada, Koji Chida (NTT Secure Platform Laboratories, Japan)
Kazuharu Misawa (Tohoku Medical Megabank Organization, Tohoku University, Japan), Satoshi Hasegawa, Koki Hamada, Koji Chida (NTT Secure Platform Laboratories, Japan), Soichi Ogishima, Masao Nagasaki(Tohoku Medical Megabank Organization, Tohoku University, Japan)
Ayaka Samejima (The University of Electro-Communications, Japan), Mitsuhiro Hatada (NTT Communications, Japan), Hiroshi Yoshiura, Masatsugu Ichino(The University of Electro-Communications, Japan)
Phetlasy Sornxayya, Satoshi Ohzahata, Celimuge Wu, Toshihiko Kato (The University of Electro-Communications, Japan)
Carmen Kempka, Ryo Kikuchi, Susumu Kiyoshima, Koutarou Suzuki (NTT Secure Platform Laboratories, Japan)
Takashi Tsuchiya, Masahiro Fujita (Shizuoka University, Japan), Kenta Takahashi (Hitachi, Ltd., Japan), Takehisa Kato (Toshiba Corporation Industrial ICT Solutions Company, Japan), Fumihiko Magata(NTT Secure Platform Laboratories, Japan), Yoshimi Teshigawara(Tokyo Denki University, Japan), Ryoichi Sasaki (Tokyo Denki University, Japan), Masakatsu Nishigaki(Shizuoka University, Japan)
Hiroshi Nakagawa (The University of Tokyo, Japan)
Hiroaki Muramatsu, Masahiro Fujita, Yuto Mano (Shizuoka University, Japan), Kenta Takahashi (Hitachi, Ltd., Japan), Masakatsu Nishigaki(Shizuoka University)
Shogo Hayashi (Institute of Industrial Science, The University of Tokyo, Japan), Yu Asabe, Keiichi Ishikawa, Yuka Takahashi, Masashi Ikarashi (The University of Tokyo, Japan), Kanta Matsuura (Institute of Industrial Science, The University of Tokyo, Japan)
Yuuichi Kamoshida, Mitsugu Iwamoto, Kazuo Ohta (The University of Electro-Communications, Japan)
Metallic-Foil Artifact-Metrics for Smart Card Security EnhancementNaoki Yoshida, Tsutomu Matsumoto (YOKOHAMA National University, Japan)
Yudai Nagamine, Naoto Yanai, Shingo Okamura, Toru Fujiwara (Osaka University, Japan)
Remarks: